In a preview stage, Code Review launches a team of agents that look for bugs in parallel, verify them to filter out false positives, and rank them by severity.

Abstract: This work presents a monolithically integrated highly-sensitive dual-gate (DG) indium gallium zinc oxide (IGZO) ion-sensitive thin-film transistor (ISTFT) array for rapid parallel label-free ...

Abstract: A novel parallel in-memory encryption design based on cross-point ferroelectric capacitor (FeCAP) arrays is proposed and experimentally demonstrated, realizing significantly improved energy ...